e-beam_evaporator
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| Both sides previous revisionPrevious revisionNext revision | Previous revision | ||
| e-beam_evaporator [2025/12/03 09:53] – Added section about etch rate. Updated desired Ar flow recommendation from 2.5 sccm to 3.0 sccm to match recent findings. fabian | e-beam_evaporator [2025/12/03 16:13] (current) – [Common errors] fabian | ||
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| * Put back the sampleholder to the original position, facing downwards. | * Put back the sampleholder to the original position, facing downwards. | ||
| - | **Etch rate** | + | === Etch rate === |
| The etch rate in theory is about half of the etch speed of the ion beam etcher in the clean room. Beam diameter of the clean room IBG is approx. 4 cm, beam diameter of the e-beam IBG is a little below 10 cm. Beam current of the clean room IBG is ~7.5 mA, beam current in the e-beam IBG is ~15 mA. | The etch rate in theory is about half of the etch speed of the ion beam etcher in the clean room. Beam diameter of the clean room IBG is approx. 4 cm, beam diameter of the e-beam IBG is a little below 10 cm. Beam current of the clean room IBG is ~7.5 mA, beam current in the e-beam IBG is ~15 mA. | ||
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| - | ==== Common errors ==== | + | ===== Common errors ===== |
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| + | * **IBG discharge failure.** If the ion beam gun power source shows the HLP26 or HLP27 error, reset the power source by pressing the button the says '' | ||
| - | * Discharge failure? If the power source shows the HLP26 or HLP27 error, reset the power source by pressing the button the says '' | ||
e-beam_evaporator.1764755630.txt.gz · Last modified: 2025/12/03 09:53 by fabian